Their paper, entitled "A Self-Testable SiGe LNA and Built-in-Self-Test Methodology for Multiple Performance Specifications of RF Amplifiers," presents a new approach for testing RF low-noise amplifier (LNA) circuits by using no external stimulus. Using this new method provides the capability for testing multiple circuit parameters and takes advantage of existing resources in typical RF receiver circuits. The paper combines both simulation and experimental results to prove that such an approach is indeed possible and provides a path towards the implementation of self-healing RF systems.