10:30 am Session 1 – Advanced Applications in EDS using Silicon Drift Detectors
In this 50 minute lecture X-ray excitation in the SEM will be reviewed, providing an understanding of how the inner workings of the modern Silicon Drift Detector (SDD) technologies increase analytical capabilities. The increases gained by the SDD allow more complex data collection routines which drive new applications in microanalysis. Specifically, phase mapping characterizes materials in a more comprehensive manner, revealing elemental distribution and associations that were not previously possible. Examples include phase mapping of ceramic materials, automotive components and low kV analysis of graphene.
11:30 am Session 2 – Integrated EDS and EBSD Analysis – Including 3D Microanalysis
This 50 minute session will start with a background and introduction to the hardware and geometrical considerations of integrated EDS and EBSD components. Signal collection, image processing and kikuchi band indexing at high speeds will be evaluated to show how high quality data, even at faster collection rates, is now possible. The analysis of large scales ranging from tens of nanometers to millimeters for a wide range of crystalline materials is the result, enabling microstructural understandings complimentary to techniques such as XRD. 3D microanalysis datasets will be explored to conclude this session.
Presenter: Tara Nylese EDAX Global Applications Manager, Mahwah, NJ
Tara Nylese is the EDAX Global Applications Manager who works with EDS, EBSD and WDS technologies. She holds a Master’s degree in Chemistry along with a Professional Science Masters (PSM) which finds the commercial end of the applied science and technology. She started her career in microanalysis primarily with SEM/EDS based techniques and over the course of her 17 years with EDAX has added the additional capabilities of EBSD and WDS into her analytical approaches. Her main emphasis is on finding ways to increase the integration between techniques to create solutions that are beyond the limit of each individual technique. Of particular interest are applications of phase mapping and how to fully characterize materials with subtle differences that create a high level of materials characterization.
Light refreshments and beverages will be served.
Please RSVP to Walter Henderson, walter.henderson@gatech.edu, by Wednesday, January 22nd .