{"44589":{"#nid":"44589","#data":{"type":"event","title":"ISyE Statistics Seminar","body":[{"value":"\u003Cp\u003E\u003Cstrong\u003EISyE Statistics Seminar: A Control Chart for the Coefficient of Variation\u003C\/strong\u003E\n\u003C\/p\u003E\n\u003Cp\u003E\u003Cstrong\u003EGUEST LECTURER\u003C\/strong\u003E\u003Cbr \/\u003E\nProfessor Chang W. Kang\n\u003C\/p\u003E\n\u003Cp\u003E\u003Cstrong\u003EAFFILIATION\u003C\/strong\u003E\u003Cbr \/\u003E\nHanyang University, Ansan, Korea\n\u003C\/p\u003E\n\u003Cp\u003E\u003Cstrong\u003EABSTRACT\u003C\/strong\u003E\u003Cbr \/\u003E\nMonitoring variability is a vital part of modern statistical process control. The conventional Shewhart R and S charts address the setting where the in-control process readings have a constant variance. In some settings, however, it is the coefficient of variation, rather than the variance, that should be constant. For example this setting is common in clinical chemistry, and then conventional R and S charts cannot be used. This paper develops a chart, equivalent to the S chart, for monitoring the coefficient of variation using rational groups of observations. (This is joint work with Man S. Lee and Young J. Seong of Hanyan University and Douglas M. Hawkins of the University of Minnesota)\u003C\/p\u003E","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"ISyE Statistics Seminar: A Control Chart for the Coefficient of Variation","format":"limited_html"}],"field_summary_sentence":[{"value":"ISyE Statistics Seminar"}],"uid":"27216","created_gmt":"2009-10-12 21:22:57","changed_gmt":"2016-10-08 01:48:27","author":"Ruth Gregory","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2007-01-17T10:05:00-05:00","event_time_end":"2007-01-17T10:55:00-05:00","event_time_end_last":"2007-01-17T10:55:00-05:00","gmt_time_start":"2007-01-17 15:05:00","gmt_time_end":"2007-01-17 15:55:00","gmt_time_end_last":"2007-01-17 15:55:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"1242","name":"School of Industrial and Systems Engineering (ISYE)"}],"categories":[],"keywords":[{"id":"6421","name":"coefficient"},{"id":"426","name":"isye"},{"id":"167250","name":"statisitcs seminar"},{"id":"6422","name":"variation"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"1795","name":"Seminar\/Lecture\/Colloquium"}],"invited_audience":[],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cstrong\u003EYajun Mei\u003C\/strong\u003E\u003Cbr \/\u003EISyE\u003Cbr \/\u003E\u003Ca href=\u0022mailto:yajun.mei@isye.gatech.edu\u0022\u003EContact Yajun Mei\u003C\/a\u003E\u003Cbr \/\u003E\u003Cstrong\u003E404-894-2300\u003C\/strong\u003E","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}