{"490991":{"#nid":"490991","#data":{"type":"event","title":"Atomic Force Microscopy User Meeting","body":[{"value":"\u003Cp\u003EDuring this meeting Bruker will have a technical presentation by our Senior Application Scientist, John Thornton, on sample prep, liquid imaging, high aspect ratio imaging \u0026amp; some of the latest electrical advances in AFM. \u003Cbr \/\u003E \u0026nbsp;\u003Cbr \/\u003E Following John\u2019s presentation we have reserved time through 5PM for questions and discussion about technical issues. We will be ready to discuss your AFM questions:\u003Cbr \/\u003E \u00b7\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp; How-to questions\u003Cbr \/\u003E \u00b7\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp; Instrument optimization\u003Cbr \/\u003E \u00b7\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp; Software manipulation\u003Cbr \/\u003E \u00b7\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp;\u0026nbsp; Upgrades, etc.\u003Cbr \/\u003E \u0026nbsp;\u003Cbr \/\u003E We are providing attendee beverages and snacks and will therefore need an accurate count of attendees.\u0026nbsp; Please register early and keep us up to date on your attendance.\u003Cbr \/\u003E \u003Cbr \/\u003E REGISTER ONLINE: \u003Ca href=\u0022http:\/\/www.bruker.com\/BNS-NA_workshops\u0022 target=\u0022_blank\u0022\u003Ewww.bruker.com\/BNS-NA_workshops\u003C\/a\u003E\u003Cbr \/\u003E FIRST 25 TO REGISTER WILL RECEIVE FREE AFM PROBES!\u003C\/p\u003E","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"If you are using an AFM from Digital Instruments, Veeco or Bruker, then this pertains to your equipment and could be a valuable meeting."}],"uid":"27863","created_gmt":"2016-01-26 15:21:36","changed_gmt":"2017-04-13 21:16:56","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2016-01-28T09:30:00-05:00","event_time_end":"2016-01-28T16:00:00-05:00","event_time_end_last":"2016-01-28T16:00:00-05:00","gmt_time_start":"2016-01-28 14:30:00","gmt_time_end":"2016-01-28 21:00:00","gmt_time_end_last":"2016-01-28 21:00:00","rrule":null,"timezone":"America\/New_York"},"extras":["free_food"],"groups":[{"id":"1271","name":"NanoTECH"},{"id":"197261","name":"Institute for Electronics and Nanotechnology"},{"id":"198081","name":"Georgia Electronic Design Center (GEDC)"},{"id":"213771","name":"The Center for MEMS and Microsystems Technologies"},{"id":"213791","name":"3D Systems Packaging Research Center"}],"categories":[],"keywords":[{"id":"3013","name":"atomic force microscopy"},{"id":"168240","name":"high aspect ration imaging"},{"id":"168241","name":"liquid imaging"},{"id":"7392","name":"microscopy"},{"id":"166968","name":"the Institute for Electronics and Nanotechnology"},{"id":"2661","name":"training"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"1795","name":"Seminar\/Lecture\/Colloquium"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78751","name":"Undergraduate students"},{"id":"78761","name":"Faculty\/Staff"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003ERathi Monikandan: \u003Ca href=\u0022mailto:%20rjeevagan3@mail.gatech.edu\u0022\u003Erjeevagan3@mail.gatech.edu\u003C\/a\u003E\u003C\/p\u003E","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}