{"50240":{"#nid":"50240","#data":{"type":"event","title":"Equivalency of Accelerated Life Testing Plans under Different Stress Loadings","body":[{"value":"\u003Cp\u003E\u003Cstrong\u003ETITLE:\u003C\/strong\u003E Equivalency of\nAccelerated Life Testing Plans under Different Stress Loadings\u003C\/p\u003E\u003Cp\u003E\u003Cstrong\u003ESPEAKER:\u003C\/strong\u003E Professor\nE. A. Elsayed\u003C\/p\u003E\n\n\u003Cp\u003E\u003Cstrong\u003EABSTRACT:\u003C\/strong\u003E\u003C\/p\u003E\u003Cp\u003EAccelerated Life\nTesting (ALT) is designed and conducted to obtain failure observations in a\nshort time by subjecting test units to severer than normal operating conditions\nand use the data for reliability prediction. Many types of stress loadings such\nas constant-stress, step-stress and cyclic-stress can be utilized when\nconducting ALT. Extensive research has been conducted on the analysis of ALT\ndata obtained under constant stress loading. However, the equivalency of ALT\nexperiments involving different stress loadings has not been investigated. In\nthis paper, we provide definitions for the equivalency of test plans, general\nequivalent ALT plans and some special types of equivalent ALT plans are explored.\nFor demonstration, a constant-stress ALT and a ramp-stress ALT for miniature\nlamps are presented and their equivalency is investigated.\u003C\/p\u003E\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E\u003Cp\u003E\u0026nbsp;\u003C\/p\u003E","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"Equivalency of Accelerated Life Testing Plans under Different Stress Loadings","format":"limited_html"}],"field_summary_sentence":[{"value":"Equivalency of Accelerated Life Testing Plans under Different Stress Loadings"}],"uid":"27187","created_gmt":"2010-01-28 15:40:12","changed_gmt":"2016-10-08 01:49:35","author":"Anita Race","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2010-02-05T11:00:00-05:00","event_time_end":"2010-02-05T12:00:00-05:00","event_time_end_last":"2010-02-05T12:00:00-05:00","gmt_time_start":"2010-02-05 16:00:00","gmt_time_end":"2010-02-05 17:00:00","gmt_time_end_last":"2010-02-05 17:00:00","rrule":null,"timezone":"America\/New_York"},"extras":["free_food"],"groups":[{"id":"1242","name":"School of Industrial and Systems Engineering (ISYE)"}],"categories":[],"keywords":[{"id":"8338","name":"ALT"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"1795","name":"Seminar\/Lecture\/Colloquium"}],"invited_audience":[],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[],"email":[],"slides":[],"orientation":[],"userdata":""}}}