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<![CDATA[IEN Imaging Seminar: Advanced nanoIR Spectroscopy for Chemistry, Materials and Life Sciences by AFM-IR and s-SNOM]]>
For a diverse range of applications in materials and life sciences, this talk will focus on the Nano-IR capabilities for measuring chemical composition and optical properties with nanometer scale spatial resolution. AFM-IR based infrared spectroscopy with true model free spectra and scattering scanning near field optical microscopy (s-SNOM) both overcome the diffraction limit. Together they provide an unrivaled capability to perform nanoscale chemical/optical analysis on a diverse range of organic, inorganic, photonic and electronic materials.
*This seminar is FREE of charge but registration is required to receive complementary lunch*
Data will include measurements from:
- Skin to core variations in single fibers
- Polymer interfaces
- Protein secondary structure
- Semiconductors
- Graphene surface plasmons
- hBN phonon polariton, and nano-antennas
Register to attend and secure your lunch for the event here.
For additional information: http://www.anasysinstruments.com or contact Jay Anderson: jay@anasysinstruments.com
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<![CDATA[Institute for Electronics and Nanotechnology]]>
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