{"582587":{"#nid":"582587","#data":{"type":"event","title":"IEN Imaging Seminar: 3D X-Ray Microscopy XRM and FIB-SEM: Recent Advances and Results in Materials Research and the Life Sciences","body":[{"value":"\u003Cp\u003EJoin us for a technical seminar on recent advances in instrumentation and methods that have opened the door for a variety of new opportunities in 3D characterization and visualization. Specifically, ZEISS X-Ray microscopes (XRM) have uniquely incorporated synchrotron-influenced optical and detection systems to push the boundaries of laboratory XRM, enabling flexible three dimensional imaging capabilities for a wide variety of applications. Similarly, improvements in FIB-SEM instrumentation have enabled new, high resolution applications spanning from nano-patterning and fabrication to 3D imaging and chemical analysis. This talk will cover an overview of XRM and FIB-SEM technology as well as prominent examples and applications, including correlative workflows.\u003C\/p\u003E\r\n\r\n\u003Ch2\u003E\u003Cstrong\u003ERegister by October the 24th to attend the seminar and receive your lunch at: \u003Ca href=\u0022https:\/\/events.r20.constantcontact.com\/register\/eventReg?oeidk=a07edbfojlca574aa58\u0026amp;oseq=\u0026amp;c=\u0026amp;ch=\u0022\u003Eien.gatech.edu\/iszeiss\u003C\/a\u003E\u003C\/strong\u003E\u003C\/h2\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"Join IEN as they present an overview of XRM and FIB-SEM technology as well as prominent examples and applications, including correlative workflows."}],"uid":"32022","created_gmt":"2016-10-14 16:47:47","changed_gmt":"2017-04-13 21:14:18","author":"Farlenthia Walker","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2016-10-26T11:00:00-04:00","event_time_end":"2016-10-26T14:00:00-04:00","event_time_end_last":"2016-10-26T14:00:00-04:00","gmt_time_start":"2016-10-26 15:00:00","gmt_time_end":"2016-10-26 18:00:00","gmt_time_end_last":"2016-10-26 18:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"217141","name":"Georgia Tech Materials Institute"}],"categories":[],"keywords":[],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"1795","name":"Seminar\/Lecture\/Colloquium"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"78751","name":"Undergraduate students"},{"id":"174045","name":"Graduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003E\u003Ca href=\u0022mailto:eric.woods@ien.gatech.edu\u0022\u003EEric Woods\u003C\/a\u003E\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}