{"592524":{"#nid":"592524","#data":{"type":"event","title":"Seminar: Application of Micro-magnetic Probe for Power Device Diagnosis","body":[{"value":"\u003Cp\u003E\u003Cstrong\u003ESeminar title:\u003C\/strong\u003E\u0026nbsp;Application of Micro-magnetic Probe for Power Device Diagnosis\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ESpeaker:\u003C\/strong\u003E\u0026nbsp;Kunihiro Asada, professor and director of the\u0026nbsp;VLSI Design and Education Center, University of Tokyo\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ESeminar abstract:\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EVDEC is developing a micro-magnetic probe composed of a small coil and a low\u0026nbsp;noise amplifier integrated on a chip. Main purpose of the probe is detection of a weak\u0026nbsp;magnetic\u0026nbsp;field generated by semiconductor devices with a high special resolution. Many\u0026nbsp;types of electronic failures of semiconductor devices are associated with abnormalities of\u0026nbsp;current flow in the devices, which generate different magnetic fields to be differentiated from\u0026nbsp;normal operations. Identification of failure location is the first step of analyzing causes of\u0026nbsp;failures. The magnetic probe is one of the best methods for this purpose. Today, recent\u0026nbsp;results on two applications of the magnetic probe will be presented.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EThe first example is detection of gate leak current of power devices; IGBT. The\u0026nbsp;location of the leakage has been successfully detected with a good agreement of a\u0026nbsp;microscopic device analysis, which was done after physically removing gate electrodes.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EThe second example is an analysis of power network integrity of LSI. By comparing a\u0026nbsp;normal chip with an intentionally fabricated abnormal one of missing via in power network,\u0026nbsp;the magnetic probe has successfully detected subtle differences in magnetic fields, which\u0026nbsp;has been again translated to an abnormal power current map analytically.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EBoth the above examples show that the micro-magnetic probe will be utilized for\u0026nbsp;improving device reliability and fabrication technologies.\u003C\/p\u003E\r\n\r\n\u003Cp\u003E\u003Cstrong\u003ESpeaker biosketch:\u003C\/strong\u003E\u003C\/p\u003E\r\n\r\n\u003Cp\u003EKunihiro Asada received the B.S., M.S., and Ph.D. from the\u0026nbsp;University of Tokyo in 1975,\u0026nbsp;1977, and 1980, respectively. In\u0026nbsp;1980 he joined the Faculty of Engineering, University of Tokyo.\u0026nbsp;From 1985 to 1986 he stayed at Edinburgh University as a visiting\u0026nbsp;scholar. From 1990 to 1992 he served as the Editor of IEICE\u0026nbsp;Transactions on Electronics. In 1996 he\u0026nbsp;established VDEC in\u0026nbsp;University of Tokyo. He served as the Chair of IEEE\/SSCS Japan\u0026nbsp;Chapter in 2001-2002 and the Chair of IEEE Japan Chapter\u0026nbsp;Operation Committee in 2007-2008. He is currently professor and\u0026nbsp;director of VDEC. His research interest is design and analysis of\u0026nbsp;integrated systems and devices. He is a member of IEEE, IEICE,\u0026nbsp;and IEEJ.\u003C\/p\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":[{"value":"\u003Cp\u003EKunihiro Asada, professor and director of the\u0026nbsp;VLSI Design and Education Center at the\u0026nbsp;\u0026nbsp;University of Tokyo, will present a seminar entitled \u0026quot;Application of Micro-magnetic Probe for Power Device Diagnosis\u0026quot; on June 23 at 10 am. The talk will be held at the Technology Square Research Building, Room 423.\u0026nbsp;\u0026nbsp;\u003C\/p\u003E\r\n","format":"limited_html"}],"field_summary_sentence":[{"value":"Kunihiro Asada, professor and director of the\u00a0VLSI Design and Education Center at the\u00a0\u00a0University of Tokyo, will present a seminar entitled \u0022Application of Micro-magnetic Probe for Power Device Diagnosis\u0022 on June 23 at 10 am in TSRB Room 423."}],"uid":"27241","created_gmt":"2017-06-08 14:57:14","changed_gmt":"2017-06-08 14:59:14","author":"Jackie Nemeth","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2017-06-23T11:00:00-04:00","event_time_end":"2017-06-23T12:00:00-04:00","event_time_end_last":"2017-06-23T12:00:00-04:00","gmt_time_start":"2017-06-23 15:00:00","gmt_time_end":"2017-06-23 16:00:00","gmt_time_end_last":"2017-06-23 16:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"1255","name":"School of Electrical and Computer Engineering"}],"categories":[],"keywords":[{"id":"174637","name":"micro-magnetic probe"},{"id":"174638","name":"integrated magnetic probe"},{"id":"174639","name":"IGBT diagnosis"},{"id":"174640","name":"power network integrity"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"78771","name":"Public"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cp\u003EMaysam Ghovanloo\u003C\/p\u003E\r\n\r\n\u003Cp\u003ESchool of Electrical and Computer Engineering\u003C\/p\u003E\r\n\r\n\u003Cp\u003E404-385-7048\u003C\/p\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}