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<![CDATA[Georgia Tech Characterization Short Course Series: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS]]>
Description:The Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on “Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS” on December 13 & 14, 2018.
This 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in XPS and/or SIMS. It will cover essential surface science analytical techniques, including point spectra, area maps, and depth profiles as well as sample preparation techniques.
Attendees will learn how to choose and prepare suitable samples, set up and execute an experiment, and analyze data. This course is suitable for both new and experienced researchers.
Target Audience:
Attendance is open to researchers from academia, industry and government laboratories/ organizations as well as to current Georgia Tech students, IEN and MCF users. Anyone who is interested in characterization of materials is invited and strongly encouraged to participate. The concepts and techniques presented are broadly applicable to materials.
Rates: *Rates include lunches on all days*
Georgia Tech Rate: $150
Academic and Government Rate: $250
Industry Rate: $500
Agenda
Day1 – Photoelectron Spectroscopy:
08:30 – Registration starts
09:00: Introduction and Scope of Short Course – Prof. F. Alamgir
Morning session including the following activities:
- Lecture onTheoretical background of Photoelectron Spectroscopy
- Tour of MCF characterization labs
- Coffee break
12:00 – 13:00: Lunch break
Afternoon session include the following activities:
- Introduction to XPS analysis software
- XPS hands-on operation and data analysis sessions.
15:10 – 16:00: General comments: Open question and answer session
Day2 – Time of Flight SIMS:
09:00 – Breakfast starts
09:30: Introduction– Prof. F. Alamgir
Morning session including the following activities:
- Tour of IEN microfabrication facility
- Coffee break
- Practical concerns for ToF-SIMS and Alternate Surface Science Techniques
11:30 – 13:00: Lunch break
Afternoon session including the following activities:
- Remote Demonstration of ToF-SIMS operation
- ToF-SIMS Data analysis and/or hands-on session.
- Open question and answer session
16:00: Closing comments
REGISTER FOR THE COURSE AT THIS LINK
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Description:
The Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on “Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS” on December 13 & 14, 2018.
This 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in XPS and/or SIMS. It will cover essential surface science analytical techniques, including point spectra, area maps, and depth profiles as well as sample preparation techniques.
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Questions? Contact:
Dr. Walter Henderson
Georgia Tech Institute for Electronics and Nanotechnology
404.894.4702
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<![CDATA[Institute for Electronics and Nanotechnology]]>
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- 213791
- 198081
- 197261
- 1271
- 213771
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10377
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26411
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109341
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84291
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167218
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179618
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97571
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174703
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178804
-
107
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12701
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173667