{"623071":{"#nid":"623071","#data":{"type":"event","title":"Keysight Technologies B1500A Demonstration","body":[{"value":"\u003Cp\u003EKeysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse\/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active\/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A\u0026rsquo;s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.\u003C\/p\u003E\r\n\r\n\u003Cp\u003EKey Features\u003C\/p\u003E\r\n\r\n\u003Cul\u003E\r\n\t\u003Cli\u003ECurrent-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A \/ 0.5 \u0026micro;V - 200 V\u003C\/li\u003E\r\n\t\u003Cli\u003EAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilities\u003C\/li\u003E\r\n\t\u003Cli\u003EAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa\/s)\u003C\/li\u003E\r\n\t\u003Cli\u003EUp to 40 V high voltage pulse forcing for non-volatile memory evaluation\u003C\/li\u003E\r\n\t\u003Cli\u003EConfigurable and upgradeable measurement modules up to 10 slots in a box\u003C\/li\u003E\r\n\t\u003Cli\u003E15-inch wide touch screen supports intuitive GUI operation of the EasyEXPERT group+\u003C\/li\u003E\r\n\t\u003Cli\u003EWindows Embedded Standard 7 (WES7)\u003C\/li\u003E\r\n\t\u003Cli\u003EGPIB, USB, LAN interfaces, and VGA video output port\u003C\/li\u003E\r\n\u003C\/ul\u003E\r\n","summary":null,"format":"limited_html"}],"field_subtitle":"","field_summary":"","field_summary_sentence":[{"value":"Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse\/dynamic IV and more, which is designed for all-round characterization."}],"uid":"27863","created_gmt":"2019-07-09 13:34:33","changed_gmt":"2019-07-09 13:34:33","author":"Christa Ernst","boilerplate_text":"","field_publication":"","field_article_url":"","field_event_time":{"event_time_start":"2019-07-11T11:00:00-04:00","event_time_end":"2019-07-11T13:00:00-04:00","event_time_end_last":"2019-07-11T13:00:00-04:00","gmt_time_start":"2019-07-11 15:00:00","gmt_time_end":"2019-07-11 17:00:00","gmt_time_end_last":"2019-07-11 17:00:00","rrule":null,"timezone":"America\/New_York"},"extras":[],"groups":[{"id":"213791","name":"3D Systems Packaging Research Center"},{"id":"198081","name":"Georgia Electronic Design Center (GEDC)"},{"id":"197261","name":"Institute for Electronics and Nanotechnology"},{"id":"1271","name":"NanoTECH"},{"id":"213771","name":"The Center for MEMS and Microsystems Technologies"}],"categories":[],"keywords":[{"id":"181679","name":"Parameter Analyzer"},{"id":"95881","name":"Characterization"},{"id":"170467","name":"electronic devices"},{"id":"1925","name":"Electrical and Computer Engineering"},{"id":"167686","name":"Semiconductors"},{"id":"178454","name":"high-performance microwave components"},{"id":"1692","name":"materials"},{"id":"12701","name":"Institute for Electronics and Nanotechnology"},{"id":"107","name":"Nanotechnology"}],"core_research_areas":[],"news_room_topics":[],"event_categories":[{"id":"10377","name":"Career\/Professional development"},{"id":"1795","name":"Seminar\/Lecture\/Colloquium"},{"id":"26411","name":"Training\/Workshop"}],"invited_audience":[{"id":"78761","name":"Faculty\/Staff"},{"id":"177814","name":"Postdoc"},{"id":"78771","name":"Public"},{"id":"174045","name":"Graduate students"},{"id":"78751","name":"Undergraduate students"}],"affiliations":[],"classification":[],"areas_of_expertise":[],"news_and_recent_appearances":[],"phone":[],"contact":[{"value":"\u003Cdiv\u003E\r\n\u003Cdiv\u003E\r\n\u003Cp\u003ESeung-Joon Paik, Ph.D.\u003C\/p\u003E\r\n\r\n\u003Cp\u003ESenior Research Engineer\u003C\/p\u003E\r\n\u003C\/div\u003E\r\n\r\n\u003Cdiv\u003Espaik8@gatech.edu\u003C\/div\u003E\r\n\u003C\/div\u003E\r\n","format":"limited_html"}],"email":[],"slides":[],"orientation":[],"userdata":""}}}