Abstract.  Perovskite solar cells promise to yield efficiencies beyond 30% by further improving the quality of the materials and devices. Electronic defect passivation, and suppression of detrimental charge-carrier recombination at the different device interfaces has been used as a strategy to achieve high performance perovskite solar cells.

In this presentation, I will discuss the role of electronic defects and how these can be passivated to improve charge-carrier lifetimes and to achieve high open-circuit voltages. I will discuss the characterization of 2D and 3D defects, such as grain boundaries, crystal surface defects, and precipitate formation within the films, by synchrotron-based characterization techniques. The importance of interfaces and their contribution to detrimental recombination will also be discussed.